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Nanoscale temperature measurement during temperature controlled in situ TEM using Al plasmon nanothermometry
Chmielewski, A., Ricolleau, C., Alloyeau, D., Wang, G., Nelayah, J.Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.112881
Date:
November, 2019
File:
PDF, 1006 KB
english, 2019