![](/img/cover-not-exists.png)
Insight into long-period pattern by depth sectioning using aberration-corrected scanning transmission electron microscope
Song, Chenzhi, Wang, Jianlin, Sun, Jianping, Liu, Yu, Chen, Pan, Li, Xiaomin, Liu, Hongquan, Ge, Binghui, Bai, XuedongVolume:
209
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.112885
Date:
February, 2020
File:
PDF, 2.04 MB
english, 2020