Insight into long-period pattern by depth sectioning using...

Ultramicroscopy 2020 / 02 Vol. 209

Insight into long-period pattern by depth sectioning using aberration-corrected scanning transmission electron microscope

Song, Chenzhi, Wang, Jianlin, Sun, Jianping, Liu, Yu, Chen, Pan, Li, Xiaomin, Liu, Hongquan, Ge, Binghui, Bai, Xuedong
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Volume:
209
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.112885
Date:
February, 2020
File:
PDF, 2.04 MB
english, 2020
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