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Modeling of Intrinsic Electron and Hole Trapping in Crystalline and Amorphous ZnO
Mora‐Fonz, David, Shluger, Alexander L.Language:
english
Journal:
Advanced Electronic Materials
DOI:
10.1002/aelm.201900760
Date:
November, 2019
File:
PDF, 5.18 MB
english, 2019