Admittance characterization of pentacene metal-insulator-semiconductor capacitors with SiO2 and SiO2/Ga2O3 insulators in temperature range of 9–300 K
Voitsekhovskii, Alexander V., Nesmelov, Sergey N., Novikov, Vadim A., Dzyadukh, Stanislav M., Kopylova, Tatyana N., Ivonin, Ivan V., Degtyarenko, Konstantin M., Tereshchenko, Evgeny V.Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2019.137622
Date:
October, 2019
File:
PDF, 1.75 MB
english, 2019