Preparing TEM Specimens and Atom Probe Tips by Laser...

Microscopy Today 2019 / 11 Vol. 27; Iss. 6

Preparing TEM Specimens and Atom Probe Tips by Laser Machining

Rottwinkel, Boris, Kreutzer, André, Spott, Henry, Krause, Michael, Schusser, Georg, Höche, Thomas
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Volume:
27
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/s1551929519001020
Date:
November, 2019
File:
PDF, 3.98 MB
english, 2019
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