Edge Contact for Carrier Injection and Transport in MoS 2 Field-Effect Transistors
Choi, Homin, Moon, Byoung Hee, Kim, Jung Ho, Yun, Seok Joon, Han, Gang Hee, Lee, Sung-gyu, Gul, Hamza Zad, Lee, Young HeeLanguage:
english
Journal:
ACS Nano
DOI:
10.1021/acsnano.9b05965
Date:
November, 2019
File:
PDF, 986 KB
english, 2019