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[IEEE 2019 16th International Multi-Conference on Systems, Signals & Devices (SSD) - Istanbul, Turkey (2019.3.21-2019.3.24)] 2019 16th International Multi-Conference on Systems, Signals & Devices (SSD) - Modeling and FEM Verification of Surface-Roughness Effect on the Static Response of RF-MEMS Switches
Nawaz, Hamid, Saleem, Muhammad Mubasher, Masood, Muhammad UmarYear:
2019
Language:
english
DOI:
10.1109/SSD.2019.8893166
File:
PDF, 537 KB
english, 2019