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IEEE Journal of the Electron Devices Society 2019

Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories

Brozek, Tomasz, Ciplickas, Dennis
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Year:
2019
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2019.2943133
File:
PDF, 1.30 MB
2019
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