Distance Metrology with Integrated Mode-locked Ring Laser

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IEEE Photonics Journal 2019

Distance Metrology with Integrated Mode-locked Ring Laser

Hei, Kefei, Shi, Guang, Hansel, Andreas, Deng, Zhongwen, Latkowski, Sylwester, Van den Berg, Steven A., Bente, Erwin, Bhattacharya, Nandini
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Year:
2019
Journal:
IEEE Photonics Journal
DOI:
10.1109/jphot.2019.2940068
File:
PDF, 923 KB
2019
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