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[IEEE 2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS) - Seoul, Korea (South) (2019.1.27-2019.1.31)] 2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS) - A Mems-Based Condensation Particle Counter for Accurate and Real-Time Monitoring of Airborne Nanoparticles at Points of Interest
Yoo, Seong Jae, Kwon, Hong-Beom, Kang, Dong-Hyun, Hong, Ui-Seon, Kim, Kyongtae, Kim, Yong-JunYear:
2019
DOI:
10.1109/memsys.2019.8870661
File:
PDF, 3.21 MB
2019