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[IEEE 2019 IEEE 37th VLSI Test Symposium (VTS) - Monterey, CA, USA (2019.4.23-2019.4.25)] 2019 IEEE 37th VLSI Test Symposium (VTS) - Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks
Ibrahim, Ahmed M. Y., Kerkhoff, Hans G., Ibrahim, Abrar, Safar, Mona, El-Kharashi, M. WatheqYear:
2019
DOI:
10.1109/vts.2019.8758635
File:
PDF, 2.71 MB
2019