Ellipsometric characterization of Bi and Al...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2019 / 11 Vol. 37; Iss. 6

Ellipsometric characterization of Bi and Al 2 O 3 coatings for plasmon excitation in an optical fiber sensor

Rodríguez-Schwendtner, Eva, Álvarez-Herrero, Alberto, Mariscal, Antonio, Serna, Rosalía, González-Cano, Agustín, Navarrete, María-Cruz, Díaz-Herrera, Natalia
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Volume:
37
Journal:
Journal of Vacuum Science & Technology B
DOI:
10.1116/1.5121590
Date:
November, 2019
File:
PDF, 1017 KB
2019
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