Integrated color photodetectors in 40 nm standard CMOS...

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IEEE Photonics Technology Letters 2019

Integrated color photodetectors in 40 nm standard CMOS technology

Cong, Jia, Yan, Dong, Tang, Jiling, Guo, Weilian, Mao, Xurui
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Year:
2019
Language:
english
Journal:
IEEE Photonics Technology Letters
DOI:
10.1109/LPT.2019.2952204
File:
PDF, 2.46 MB
english, 2019
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