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[IEEE 2018 IEEE Conference on Visual Analytics Science and Technology (VAST) - Berlin, Germany (2018.10.21-2018.10.26)] 2018 IEEE Conference on Visual Analytics Science and Technology (VAST) - EmbeddingVis: A Visual Analytics Approach to Comparative Network Embedding Inspection
Li, Quan, Njotoprawiro, Kristanto Sean, Haleem, Hammad, Chen, Qiaoan, Yi, Chris, Ma, XiaojuanYear:
2018
Language:
english
DOI:
10.1109/VAST.2018.8802454
File:
PDF, 860 KB
english, 2018