Measurement of the Energy Resolution of Silicon X-Ray Detectors Using Absorption Edge Spectra
Osadchii, S. M., Petukhov, A. A., Dunin, V. B.Language:
english
Journal:
Measurement Techniques
DOI:
10.1007/s11018-019-01646-6
Date:
November, 2019
File:
PDF, 1.58 MB
english, 2019