Measurement of the Energy Resolution of Silicon X-Ray...

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Measurement of the Energy Resolution of Silicon X-Ray Detectors Using Absorption Edge Spectra

Osadchii, S. M., Petukhov, A. A., Dunin, V. B.
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Language:
english
Journal:
Measurement Techniques
DOI:
10.1007/s11018-019-01646-6
Date:
November, 2019
File:
PDF, 1.58 MB
english, 2019
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