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[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Developing a Configurable Fault Tolerant Multicore System for Optimized Sensor Processing
Ulbricht, Markus, Syed, Rizwan Tariq, Krstic, MilosYear:
2019
Language:
english
DOI:
10.1109/dft.2019.8875433
File:
PDF, 287 KB
english, 2019