[IEEE 2018 International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2018.10.7-2018.10.11)] 2018 International Integrated Reliability Workshop (IIRW) - Self-Heating Effects on Hot Carrier Degradation and its Impact on Ring-Oscillator Reliability
Paliwoda, P., Chbili, Z., Kerber, A., Nigam, T., Singh, D., Nagahiro, K., Manik, P.P, Cimino, S., Misra, D.Year:
2018
DOI:
10.1109/iirw.2018.8727093
File:
PDF, 291 KB
2018