[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Comparison of Radiation Hardness of Stacked Transmission-Gate Flip Flop and Stacked Tristate-Inverter Flip Flop in a 65 nm Thin BOX FDSOI Process
Ebara, Mitsunori, Yamada, Kodai, Furuta, Jun, Kobayashi, KazutoshiYear:
2019
Language:
english
DOI:
10.1109/iolts.2019.8854436
File:
PDF, 154 KB
english, 2019