[IEEE 2019 IEEE International Test Conference in Asia...

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[IEEE 2019 IEEE International Test Conference in Asia (ITC-Asia) - Tokyo, Japan (2019.9.3-2019.9.5)] 2019 IEEE International Test Conference in Asia (ITC-Asia) - Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices

Gao, Zhan, Hu, Min-Chun, Swenton, Joe, Malagi, Santosh, Huisken, Jos, Goossens, Kees, Marinissen, Erik Jan
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Year:
2019
Language:
english
DOI:
10.1109/itc-asia.2019.00029
File:
PDF, 913 KB
english, 2019
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