[IEEE 2019 IEEE 5th International forum on Research and Technology for Society and Industry (RTSI) - Florence, Italy (2019.9.9-2019.9.12)] 2019 IEEE 5th International forum on Research and Technology for Society and Industry (RTSI) - Analytical Model of Power MOSFET Switching Losses due to Parasitic Components
Locorotondo, Edoardo, Pugi, Luca, Corti, Fabio, Becchi, Lorenzo, Grasso, FrancescoYear:
2019
Language:
english
DOI:
10.1109/rtsi.2019.8895562
File:
PDF, 2.30 MB
english, 2019