Freewheeling Diode Technology With Low Loss and High...

IEEE Transactions on Electron Devices 2019 / 11 Vol. 66; Iss. 11

Freewheeling Diode Technology With Low Loss and High Dynamic Ruggedness in High-Speed IGBT Applications

Nakamura, Katsumi, Masuoka, Fumihito, Nishii, Akito, Nishizawa, Shin-ichi, Furukawa, Akihiko
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Volume:
66
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2019.2941710
Date:
November, 2019
File:
PDF, 4.93 MB
english, 2019
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