Gross Die Per Wafer and Yield Optimization for GaAs ICs...

IEEE Transactions on Semiconductor Manufacturing 2019 / 11 Vol. 32; Iss. 4

Gross Die Per Wafer and Yield Optimization for GaAs ICs With Sub-Micron Features

Best, Robbie M., Tiku, Shiban K.
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Volume:
32
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2019.2943399
Date:
November, 2019
File:
PDF, 5.51 MB
english, 2019
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