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[IEEE 2019 IEEE International Test Conference in Asia (ITC-Asia) - Tokyo, Japan (2019.9.3-2019.9.5)] 2019 IEEE International Test Conference in Asia (ITC-Asia) - Instruction Vulnerability Test and Code Optimization Against DVFS Attack
Huang, Junying, Ye, Jing, Ye, Xiaochun, Wang, Da, Fan, Dongrui, Li, Huawei, Li, Xiaowei, Zhang, ZhiminYear:
2019
DOI:
10.1109/itc-asia.2019.00022
File:
PDF, 1.22 MB
2019