P‐6.9: High‐reliability a‐Si:H TFT with Repressing...

SID Symposium Digest of Technical Papers 2019 / 09 Vol. 50; Iss. S1

P‐6.9: High‐reliability a‐Si:H TFT with Repressing Photo‐degradation on G8.6 LCDs

Chao, Wei, An-Thung, Cho, Hejing, Zhang, Qionghua, Mo, Zhen, Liu, Fengyun, Yang, Kaijun, Liu, James, Hsu
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Volume:
50
Language:
english
Journal:
SID Symposium Digest of Technical Papers
DOI:
10.1002/sdtp.13645
Date:
September, 2019
File:
PDF, 286 KB
english, 2019
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