Parallel Ion Electron Spectrometry (PIES): A New Paradigm...

Microscopy and Microanalysis 2015 / 08 Vol. 21; Iss. S3

Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS

Eswara Moorthy, S., Dowsett, D., Yedra, L., Wirtz, T.
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Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615010077
Date:
August, 2015
File:
PDF, 194 KB
english, 2015
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