Calculating electrostatic interactions in atomic force...

Calculating electrostatic interactions in atomic force microscopy with semiconductor samples

Xu, Jie, Li, Jinze, Li, Wei
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Volume:
9
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.5110482
Date:
October, 2019
File:
PDF, 1.64 MB
english, 2019
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