Secondary ion mass spectrometry to verify the implantation...

Journal of Applied Physics 2019 / 11 Vol. 126; Iss. 17

Secondary ion mass spectrometry to verify the implantation of magnetic ions in nanodiamonds

Lin, Bo-Rong, Wang, Chiung-Chi, Chen, Chien-Hsu, Kunuku, Srinivasu, Hsiao, Tung-Yuan, Yu, Hung-Kai, Chen, Tzung-Yuang, Chang, Yu-Jen, Liao, Li-Chuan, Chang, Chun-Hsiang, Chen, Fang-Hsin, Niu, Huan, Le
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Volume:
126
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5117342
Date:
November, 2019
File:
PDF, 1.69 MB
english, 2019
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