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[IEEE 2019 XIth International Scientific and Practical Conference on Electronics and Information Technologies (ELIT) - Lviv, Ukraine (2019.9.16-2019.9.18)] 2019 XIth International Scientific and Practical Conference on Electronics and Information Technologies (ELIT) - Detection of Subsurface Defects in Composite Panels Using Dynamic Speckle Patterns
Muravsky, Leonid, Kuts, Oleksandr, Gaskevych, Georgiy, Suriadova, OlgaYear:
2019
Language:
english
DOI:
10.1109/ELIT.2019.8892294
File:
PDF, 1.62 MB
english, 2019