[IEEE 2019 IEEE East-West Design & Test Symposium (EWDTS) - Batumi, Georgia (2019.9.13-2019.9.16)] 2019 IEEE East-West Design & Test Symposium (EWDTS) - A Template Model of Junction Field-Effect Transistors for a Wide Temperature Range
Pilipenko, Alexandr M., Biryukov, Vadim N., Prokopenko, Nikolay N.Year:
2019
Language:
english
DOI:
10.1109/EWDTS.2019.8884411
File:
PDF, 417 KB
english, 2019