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DC and 28 GHz reliability of a SOI FET technology
Gutierrez, Edmundo A., Mendez, Jairo, Tinoco, Julio, Torres, Emmanuel, Huerta, Oscar V.Year:
2019
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2019.2952449
File:
PDF, 10.37 MB
english, 2019