Detection of fraud risks in retailing sector using MLP and SVM techniques
PEHLİVANLI, Davut, EKEN, Süleyman, AYAN, EbubekirVolume:
27
Language:
english
Journal:
TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES
DOI:
10.3906/elk-1902-18
Date:
September, 2019
File:
PDF, 626 KB
english, 2019