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Threshold Voltage Instability of Diamond Metal–Oxide–Semiconductor Field‐Effect Transistors Based on 2D Hole Gas
Yang, Mingchao, Sang, Liwen, Liao, Meiyong, Imura, Masataka, Li, Hongdong, Koide, YasuoLanguage:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201900538
Date:
November, 2019
File:
PDF, 1.38 MB
english, 2019