Frequency and Voltage Dependence of the Dielectric Properties of Ni/SiO2/P-Si (MOS) Structure
Mahani, Ragab, Ashery, A., Elnasharty, Mohamed M. M.Language:
english
Journal:
Silicon
DOI:
10.1007/s12633-019-00277-4
Date:
November, 2019
File:
PDF, 658 KB
english, 2019