Frequency and Voltage Dependence of the Dielectric...

Frequency and Voltage Dependence of the Dielectric Properties of Ni/SiO2/P-Si (MOS) Structure

Mahani, Ragab, Ashery, A., Elnasharty, Mohamed M. M.
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Language:
english
Journal:
Silicon
DOI:
10.1007/s12633-019-00277-4
Date:
November, 2019
File:
PDF, 658 KB
english, 2019
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