[IEEE 2019 AEIT International Annual Conference (AEIT) -...

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[IEEE 2019 AEIT International Annual Conference (AEIT) - Florence, Italy (2019.9.18-2019.9.20)] 2019 AEIT International Annual Conference (AEIT) - High Resistance Faults in EHV/HV grids: EF protections and detection logics

Bassi, Fabio, Caciolli, Leandro, Giannuzzi, Giorgio Maria, Giorgi, Alberto, Nesi, Niccolo, Vignolini, Luciano
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Year:
2019
Language:
english
DOI:
10.23919/AEIT.2019.8893384
File:
PDF, 282 KB
english, 2019
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