![](/img/cover-not-exists.png)
[IEEE 2019 AEIT International Annual Conference (AEIT) - Florence, Italy (2019.9.18-2019.9.20)] 2019 AEIT International Annual Conference (AEIT) - High Resistance Faults in EHV/HV grids: EF protections and detection logics
Bassi, Fabio, Caciolli, Leandro, Giannuzzi, Giorgio Maria, Giorgi, Alberto, Nesi, Niccolo, Vignolini, LucianoYear:
2019
Language:
english
DOI:
10.23919/AEIT.2019.8893384
File:
PDF, 282 KB
english, 2019