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Accumulated and aggregated shifting of intensity for defect detection on micro 3D textured surfaces
Yan, Yaping, Kaneko, Shun’ichi, Asano, HirokazuVolume:
98
Language:
english
Journal:
Pattern Recognition
DOI:
10.1016/j.patcog.2019.107057
Date:
February, 2020
File:
PDF, 1.90 MB
english, 2020