Transmission Electron Microscope Analysis of Grain...

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Transmission Electron Microscope Analysis of Grain Boundaries, Twins, and Planar Defects in Cr2B- and Fe2B-Type Borides

Kotani, Keiko, Ishimasa, Tsutomu, Oki, Takeo
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Volume:
57
Year:
1993
DOI:
10.2320/jinstmet1952.57.2_125
File:
PDF, 2.53 MB
1993
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