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Journal of Intelligent Manufacturing 2019 / 10

Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel

Kim, Myeongso, Lee, Minyoung, An, Minjeong, Lee, Hongchul
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Journal:
Journal of Intelligent Manufacturing
DOI:
10.1007/s10845-019-01502-y
Date:
October, 2019
File:
PDF, 1.42 MB
2019
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