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[IEEE 2019 International Conference on Applied Electronics (AE) - Pilsen, Czech Republic (2019.9.10-2019.9.11)] 2019 International Conference on Applied Electronics (AE) - Data Validation System Using QR Code and Meaningless Reversible Degradation
Freitas, Lucas F., Nogueira, Adalberto R., Melgar, Max E. VizcarraYear:
2019
Language:
english
DOI:
10.23919/AE.2019.8867027
File:
PDF, 365 KB
english, 2019