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[IEEE 2019 Chinese Control Conference (CCC) - Guangzhou, China (2019.7.27-2019.7.30)] 2019 Chinese Control Conference (CCC) - Two-step Convolutional Neural Network for Image Defect Detection
Zhang, Mei, Wu, Jinglan, Yuan, Peng, Zhu, JinhuiYear:
2019
Language:
english
DOI:
10.23919/ChiCC.2019.8866625
File:
PDF, 524 KB
english, 2019