Contact Resonance Atomic Force Microscopy Using Long,...

Sensors 2019 / 11 Vol. 19; Iss. 22

Contact Resonance Atomic Force Microscopy Using Long, Massive Tips

Jaquez-Moreno, Tony, Aureli, Matteo, Tung, and Ryan C.
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Volume:
19
Language:
english
Journal:
Sensors
DOI:
10.3390/s19224990
Date:
November, 2019
File:
PDF, 2.28 MB
english, 2019
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