Using a 2x‐thru standard to achieve accurate de‐embedding...

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Using a 2x‐thru standard to achieve accurate de‐embedding of measurements

Ellison, Jason, Smith, Stephen B., Agili, Sedig
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Language:
english
Journal:
Microwave and Optical Technology Letters
DOI:
10.1002/mop.32098
Date:
October, 2019
File:
PDF, 2.58 MB
english, 2019
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