[IEEE 2019 16th International Conference on Machine Vision...

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[IEEE 2019 16th International Conference on Machine Vision Applications (MVA) - Tokyo, Japan (2019.5.27-2019.5.31)] 2019 16th International Conference on Machine Vision Applications (MVA) - Single-wavelength and multi-parallel dotted- and solid-lines for dense and robust active 3D reconstruction

Nagamatsu, Genki, Furukawa, Ryo, Sagawa, Ryusuke, Kawasaki, Hiroshi
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Year:
2019
DOI:
10.23919/mva.2019.8758011
File:
PDF, 2.86 MB
2019
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