Limitations for Reliable Operation at Elevated Temperatures...

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Limitations for Reliable Operation at Elevated Temperatures of Al 2 O 3 /AlGaN/GaN MISHEMTs Grown by MOCVD on Silicon Substrate

Heuken, Lars, Ottaviani, Alessandro, Fahle, Dirk, Zweipfennig, Thorsten, Lükens, Gerrit, Kalisch, Holger, Vescan, Andrei, Heuken, Michael, Burghartz, Joachim N.
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Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201900697
Date:
November, 2019
File:
PDF, 662 KB
2019
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