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Count Your Toggles: a New Leakage Model for Pre-Silicon Power Analysis of Crypto Designs
Sadhukhan, Rajat, Mathew, Paulson, Roy, Debapriya Basu, Mukhopadhyay, DebdeepJournal:
Journal of Electronic Testing
DOI:
10.1007/s10836-019-05826-8
Date:
November, 2019
File:
PDF, 2.29 MB
2019