The retrieval of a thin silver film dielectric constant by resonant approach
Puzko, R.S., Ivanov, A.I., Lotkov, E.S., Rodionov, I.A., Ryzhikov, I.A., Baryshev, A.V., Merzlikin, A.M.Volume:
456
Journal:
Optics Communications
DOI:
10.1016/j.optcom.2019.124636
Date:
February, 2020
File:
PDF, 1.39 MB
2020