Three-Tiered Risk Assessment for Engineered Nanomaterials....

Journal of Physics Conference Series 2019 / 10 Vol. 1323

Three-Tiered Risk Assessment for Engineered Nanomaterials. A Use Case for the Semiconductor Industry

Prodanov, Dimiter, Belde, Peter, Geerts, Lieve, L’Allain, Catherine, Feber, Maaike Le, Moclair, Fiona, Morelli, Attilio, Roquet, Pascal
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Volume:
1323
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/1323/1/012010
Date:
October, 2019
File:
PDF, 426 KB
english, 2019
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