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[IEEE 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Auckland, New Zealand (2019.5.20-2019.5.23)] 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Automatic feature extraction method for crack detection in eddy current testing
Tao, Yang, Xu, Hanyang, Chen, Ziqi, Huang, Ruochen, Ran, Qiaoye, Zhao, Qian, Yan, Han, Zhang, Zhijie, Yin, WuliangYear:
2019
Language:
english
DOI:
10.1109/i2mtc.2019.8827027
File:
PDF, 458 KB
english, 2019