Microwave Linear Characterization Procedures of On-Wafer...

Electronics 2019 / 11 Vol. 8; Iss. 11

Microwave Linear Characterization Procedures of On-Wafer Scaled GaAs pHEMTs for Low-Noise Applications

Caddemi, Alina, Cardillo, Emanuele, Crupi, Giovanni, Boglione, Luciano, Roussos, Jason
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Volume:
8
Language:
english
Journal:
Electronics
DOI:
10.3390/electronics8111365
Date:
November, 2019
File:
PDF, 7.80 MB
english, 2019
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