P‐1.6: Highly Stable LTPS TFT on Si Wafer under High...

SID Symposium Digest of Technical Papers 2019 / 09 Vol. 50; Iss. S1

P‐1.6: Highly Stable LTPS TFT on Si Wafer under High Current Stress

Do, Youngbin, Lee, Suhui, Jeong, Duk Young, Jang, Jin
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Volume:
50
Language:
english
Journal:
SID Symposium Digest of Technical Papers
DOI:
10.1002/sdtp.13600
Date:
September, 2019
File:
PDF, 487 KB
english, 2019
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