Carrier Lifetimes and Influence of In-Grown Defects in N-B Co-Doped 6H-SiC
Grivickas, V, Gulbinas, K, Jokubavičius, V, Sun, J W, Karaliūnas, M, Kamiyama, S, Linnarsson, M, Kaiser, M, Wellmann, P, Syväjärvi, MVolume:
56
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/56/1/012004
Date:
March, 2014
File:
PDF, 3.85 MB
english, 2014